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6N137 查看數據表(PDF) - QT Optoelectronics => Fairchildsemi

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6N137 Optocoupler. 10 Mbit/s High-Speed Logic Gate Output; GaAsP Input QT
QT Optoelectronics => Fairchildsemi QT
6N137 Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
HIGH SPEED-10 MBit/s
LOGIC GATE OPTOCOUPLERS
SINGLE-CHANNEL
6N137
HCPL-2601
HCPL-2611
DUAL-CHANNEL
HCPL-2630
HCPL-2631
TRANSFER CHARACTERISTICS (TA = -40°C to +85°C Unless otherwise specified.)
DC Characteristics
Test Conditions Symbol
Min
Typ**
Max
Unit
High Level Output Current
(VCC = 5.5 V, VO = 5.5 V)
(IF = 250 µA, VE = 2.0 V) (Note 2)
IOH
Low Level Output Current
(VCC = 5.5 V, IF = 5 mA)
(VE = 2.0 V, ICL = 13 mA) (Note 2)
VOL
Input Threshold Current
(VCC = 5.5 V, VO = 0.6 V,
VE = 2.0 V, IOL = 13 mA)
IFT
100
µA
.35
.06
V
3
5
mA
ISOLATION CHARACTERISTICS (TA = -40°C to +85°C Unless otherwise specified.)
Characteristics
Test Conditions Symbol
Min
Typ**
Max
Unit
Input-Output
(Relative humidity = 45%)
Insulation Leakage Current
(TA = 25°C, t = 5 s)
(VI-O = 3000 VDC)
II-O
(Note 12)
1.0*
µA
Withstand Insulation Test Voltage
(RH < 50%, TA = 25°C)
(Note 12) ( t = 1 min.)
VISO
2500
VRMS
Resistance (Input to Output)
(VI-O = 500 V) (Note 12)
RI-O
1012
!
Capacitance (Input to Output)
(f = 1 MHz) (Note 12)
CI-O
0.6
pF
** All typical values are at VCC = 5 V, TA = 25°C
NOTES
1. The VCC supply to each optoisolator must be bypassed by a 0.1µF capacitor or larger. This can be either a ceramic or solid tantalum
capacitor with good high frequency characteristic and should be connected as close as possible to the package VCC and GND pins
of each device.
2. Each channel.
3. Enable Input - No pull up resistor required as the device has an internal pull up resistor.
4. tPLH - Propagation delay is measured from the 3.75 mA level on the HIGH to LOW transition of the input current pulse to the 1.5 V
level on the LOW to HIGH transition of the output voltage pulse.
5. tPHL - Propagation delay is measured from the 3.75 mA level on the LOW to HIGH transition of the input current pulse to the 1.5 V
level on the HIGH to LOW transition of the output voltage pulse.
6. tr - Rise time is measured from the 90% to the 10% levels on the LOW to HIGH transition of the output pulse.
7. tf - Fall time is measured from the 10% to the 90% levels on the HIGH to LOW transition of the output pulse.
8. tELH - Enable input propagation delay is measured from the 1.5 V level on the HIGH to LOW transition of the input voltage pulse
to the 1.5 V level on the LOW to HIGH transition of the output voltage pulse.
9. tEHL - Enable input propagation delay is measured from the 1.5 V level on the LOW to HIGH transition of the input voltage pulse
to the 1.5 V level on the HIGH to LOW transition of the output voltage pulse.
10. CMH - The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state
(i.e., VOUT > 2.0 V). Measured in volts per microsecond (V/µs).
11. CML - The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the low output state
(i.e., VOUT < 0.8 V). Measured in volts per microsecond (V/µs).
12. Device considered a two-terminal device: Pins 1,2,3 and 4 shorted together, and Pins 5,6,7 and 8 shorted together.
8/10/99 200002A
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